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From Routing Delay Shifts to Silent Data Corruption: Neutron-Induced SEU Effects in AXI
Reporting by ArXiv Systems and ControlRead the original at arxiv.org
Executive Summary
Facts Only
* SRAM-based FPGA systems are vulnerable to single-event upsets (SEUs) in configuration memory.
* Routing disturbances can introduce small propagation delay shifts that compromise AXI-based data transfers.
* Neutron irradiation experiments were conducted on a ZCU104 platform integrating routing delay sensors and an AXI interconnect benchmark.
* A frame-level configuration fault injector emulated upsets via the internal configuration access port.
* Measured routing delay events were statistically correlated with communication failures.
* Cross-sections for both timing shifts and AXI malfunctions were derived.
* The experimental results demonstrate how neutron-induced routing perturbations propagate into system-level silent data corruption in UltraScale+ MPSoCs.
Full Take
From the original · ArXiv Systems and Control
Electrical Engineering and Systems Science > Systems and Control [Submitted on 24 Sep 2026] Title:From Routing Delay Shifts to Silent Data Corruption: Neutron-Induced SEU Effects in AXI-Based Zynq UltraScale+ MPSoCs View PDFAbstract:SRAM-based FPGA system-on-chip devices are vulnerable to single-event upsets (SEUs) in configuration memory, which may perturb programmable routing resources and…Read the full story at arxiv.org
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